1、 Product Overview:

Axia ChemiSEM scanning electron microscope can collect, process, and display sample composition information; Relying on advanced mirror tube technology, the system is always in a stable state, capable of focusing on sample collection data and providing high-quality images; Adopting a fully open door design, it has higher durability and flexibility; It can be equipped with multiple scanning electron microscope software to achieve various automation functions; Minimalist design with excellent performance in all aspects, capable of characterizing various types of materials and providing comprehensive information. Its imaging platform is instantly available, integrated with real-time quantitative energy spectrum analysis function, imaging is instant and integrates component information, designed for rapid analysis, and operation is easy and free.

2、 Product parameters:

Emission source: pre aligned tungsten filament

Resolution: 3.0nm @ 30kV (SE); 8.0 nm @ 3kV (SE)

Magnification factor: 5~1000000 × (Enlarged by Polaroid Corporation photo paper)

Acceleration voltage range: 200V~30kV

Probe current range: up to 2 μ A. Continuously adjustable

X-Ray working distance: 10 mm, EDS detection angle: 35 °

Sample room: internal width 280mm, 10 ports

Sample table: Five axis fully automatic motor drive

☆ X=120 mm,

☆ Y=120 mm,

☆ Z=55 mm,

☆ T=-15 º~90 º,

☆ R=360 º (continuous rotation)

☆ Load bearing 10 kg

Detector system:

☆ High vacuum Secondary electrons detector ETD

☆ Scalable backscatter detector BSED

☆ Sample indoor infrared camera CCD

☆ Image navigation color optical camera Nav Cam+ ™

☆ TrueSight X EDS detector with ChemiSEM technology

Control system:

☆ Operating system: Windows 10

☆ Image display: 24 inch LCD display with high display resolution of 1920 × one thousand and two hundred

☆ Support user-defined GUI, which can simultaneously display four images in real-time

☆ The software supports undo and redo functions

Real time component information: Perform energy spectrum analysis while synchronously scanning to obtain multiple signals, and detect morphology and element information in real-time;

The imaging platform is instantly available: just focus on data collection and don't worry about setting electron microscope conditions;

Quickly obtain data: multiple imaging and scanning strategies to optimize image acquisition effects and enhance system processing capabilities;

Flexible sample table design: fully open door design, large samples can be easily loaded